Actions

Difference between revisions of "Diffraction symbol"

From Online Dictionary of Crystallography

m (hyphens outside the subscript close tag)
m (Style edits to align with printed edition)
 
(One intermediate revision by the same user not shown)
Line 1: Line 1:
<font color="blue">Symbole de diffraction</font> (''Fr''); <font color="black">Simbolo di diffrazione</font> (''It''); <font color="purple">回折記号</font> (''Ja'').
+
<font color="blue">Symbole de diffraction</font> (''Fr''). <font color="red">Beugungssymbol</font> (''Ge''). <font color="black">Simbolo di diffrazione</font> (''It''). <font color="purple">回折記号</font> (''Ja''). <font color="green">Símbolo de difracción</font> (''Sp'').
  
  
 
'''Diffraction symbols''' were introduced to represent, in as compact a form as possible, all the information that has been obtained by X-ray diffraction concerning the symmetry of a crystalline species. Two symbolisms have been proposed
 
'''Diffraction symbols''' were introduced to represent, in as compact a form as possible, all the information that has been obtained by X-ray diffraction concerning the symmetry of a crystalline species. Two symbolisms have been proposed
* Donnay & Harker introduced the concept of '''aspect''' as a statement of a set of criteria that govern the systematic absences in one or several space groups, in any given crystal system. The aspect symbol is composed by the capital letter representing the type of unit cell, the screw axes or glide planes that can be inferred by the [[systematic absences]] and asterisks (*) in the positions of symmetry elements that cannot be determined by these.
+
* Donnay and Harker introduced the concept of '''aspect''' as a statement of a set of criteria that govern the systematic absences in one or several space groups, in any given crystal system. The aspect symbol is composed of the capital letter representing the type of unit cell, the screw axes or glide planes that can be inferred by the [[systematic absences]] and asterisks (*) in the positions of symmetry elements that cannot be determined by these.
* Buerger introduced a '''diffraction symbol''' composed by the symbol of the [[Laue classes|Laue class]] followed by the aspect symbol where hyphens (-) are used instead of asterisks
+
* Buerger introduced a '''diffraction symbol''' composed of the symbol of the [[Laue classes|Laue class]] followed by the aspect symbol where hyphens (-) are used instead of asterisks.
  
  
Line 10: Line 10:
  
  
The diffraction symbol is richer in information than the aspect symbol. For example, Space groups of type ''I''4<sub>1</sub> and ''I''4<sub>1</sub>22 have the same aspect symbol ''I''4<sub>1</sub>** but two different diffraction symbols 4/''mI''4<sub>1</sub>-- and 4/''mmmI''4<sub>1</sub>--.
+
The diffraction symbol is richer in information than the aspect symbol. For example, space groups of type ''I''4<sub>1</sub> and ''I''4<sub>1</sub>22 have the same aspect symbol ''I''4<sub>1</sub>** but two different diffraction symbols 4/''mI''4<sub>1</sub>-- and 4/''mmmI''4<sub>1</sub>--.
  
  
Line 16: Line 16:
  
 
=== References ===
 
=== References ===
*Donnay, J. D. H. & Harker, D. (1940). ''Naturaliste canadien'', '''67''', 33, 160.
+
*Donnay, J. D. H. and Harker, D. (1940). ''Naturaliste canadien'', '''67''', 33, 160.
*Donnay, J. D. H. & Kennard, O (1964). ''Acta Cryst'', '''17''', 1337-1340 [erratum:  ''Acta Cryst'', '''A25''' (1969), 394]
+
*Donnay, J. D. H. and Kennard, O (1964). ''Acta Cryst.'' '''17''', 1337-1340 [erratum:  ''Acta Cryst.'' (1969), A'''25''', 394].
*Buerger, M.J. (1942). ''X-ray Crystallography''. New York : Wiley.
+
*Buerger, M.J. (1942). ''X-ray Crystallography''. New York: Wiley.
  
 
[[Category:X-rays]]
 
[[Category:X-rays]]

Latest revision as of 14:01, 29 November 2017

Symbole de diffraction (Fr). Beugungssymbol (Ge). Simbolo di diffrazione (It). 回折記号 (Ja). Símbolo de difracción (Sp).


Diffraction symbols were introduced to represent, in as compact a form as possible, all the information that has been obtained by X-ray diffraction concerning the symmetry of a crystalline species. Two symbolisms have been proposed

  • Donnay and Harker introduced the concept of aspect as a statement of a set of criteria that govern the systematic absences in one or several space groups, in any given crystal system. The aspect symbol is composed of the capital letter representing the type of unit cell, the screw axes or glide planes that can be inferred by the systematic absences and asterisks (*) in the positions of symmetry elements that cannot be determined by these.
  • Buerger introduced a diffraction symbol composed of the symbol of the Laue class followed by the aspect symbol where hyphens (-) are used instead of asterisks.


For example, the symmorphic space groups of type Pmmm, P222, Pmm2, P2mm, Pm2m are all represented by the aspect symbol P*** or the diffraction symbol mmmP---.


The diffraction symbol is richer in information than the aspect symbol. For example, space groups of type I41 and I4122 have the same aspect symbol I41** but two different diffraction symbols 4/mI41-- and 4/mmmI41--.


In the International Tables for Crystallography, the aspect symbol was adopted in the 1952 edition with dots replacing asterisks or hyphens. In later editions, hyphens were adopted. The term aspect symbol was changed to extinction symbol. In the sixth edition of Volume A, the extinction symbol is no longer present, but the criteria to obtain it are all given.

References

  • Donnay, J. D. H. and Harker, D. (1940). Naturaliste canadien, 67, 33, 160.
  • Donnay, J. D. H. and Kennard, O (1964). Acta Cryst. 17, 1337-1340 [erratum: Acta Cryst. (1969), A25, 394].
  • Buerger, M.J. (1942). X-ray Crystallography. New York: Wiley.