Difference between revisions of "Statistical descriptors"
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| − | A separate online document [http://www.iucr.org/iucr-top/comm/cnom/statdes/preface.html Statistical Descriptors in Crystallography] prepared for the International Union of Crystallography provides an | + | A separate online document [http://www.iucr.org/iucr-top/comm/cnom/statdes/preface.html Statistical Descriptors in Crystallography] prepared for the International Union of Crystallography provides an authoritative statement on some aspects of the use of statistics and statistical techniques in crystallography, principally that of least-squares refinement of diffraction data against an atomic model. The following topics are treated: |
<ul> | <ul> | ||
<li> [http://www.iucr.org/iucr-top/comm/cnom/statdes/index.html#gloss Glossary] | <li> [http://www.iucr.org/iucr-top/comm/cnom/statdes/index.html#gloss Glossary] | ||
Revision as of 14:42, 15 February 2006
Overview
A separate online document Statistical Descriptors in Crystallography prepared for the International Union of Crystallography provides an authoritative statement on some aspects of the use of statistics and statistical techniques in crystallography, principally that of least-squares refinement of diffraction data against an atomic model. The following topics are treated:
- Glossary
- Basic notions
- Uncertainty of measurement
- Refinement
- Refinement on I, |F|2 or |F|?
- Defects in the model
- Weighting schemes
- Recommendations
See also
Part 8 of International Tables of Crystallography, Volume C