Difference between revisions of "X-ray absorption spectroscopy (XAS)"
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| + | <font color="blue">Spectrométrie d'absorption des rayons X</font> (''Fr''); <font color="red">Röntgenabsorptionsspektroskopie</font> (''Ge''); <font color="black">Spettroscopia XAS</font> (''It''); <font color="purple">X線吸収分光法</font> (''Ja''). | ||
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== Definition == | == Definition == | ||
X-ray Absorption Spectroscopy (XAS) is a technique for measuring the linear absorption coefficient µ(E) of a substance as a function of the incident photon energy E in the X-ray regime. This technique is element and orbital-specific and determines the local atomic and electronic structure of matter. XAS conventionally includes techniques of [[X-ray absorption fine structure (XAFS)|XAFS]] (''q.v.''), which in turn includes both XANES and [[EXAFS - Extended X-ray absorption fine structure|EXAFS]] (''q.v.''). An XAS spectrum may also be obtained using fluorescence, electron yield and scattering processes indirectly (''i.e.'' without directly measuring the absorption of X-rays). | X-ray Absorption Spectroscopy (XAS) is a technique for measuring the linear absorption coefficient µ(E) of a substance as a function of the incident photon energy E in the X-ray regime. This technique is element and orbital-specific and determines the local atomic and electronic structure of matter. XAS conventionally includes techniques of [[X-ray absorption fine structure (XAFS)|XAFS]] (''q.v.''), which in turn includes both XANES and [[EXAFS - Extended X-ray absorption fine structure|EXAFS]] (''q.v.''). An XAS spectrum may also be obtained using fluorescence, electron yield and scattering processes indirectly (''i.e.'' without directly measuring the absorption of X-rays). | ||
Revision as of 22:12, 18 December 2016
Spectrométrie d'absorption des rayons X (Fr); Röntgenabsorptionsspektroskopie (Ge); Spettroscopia XAS (It); X線吸収分光法 (Ja).
Definition
X-ray Absorption Spectroscopy (XAS) is a technique for measuring the linear absorption coefficient µ(E) of a substance as a function of the incident photon energy E in the X-ray regime. This technique is element and orbital-specific and determines the local atomic and electronic structure of matter. XAS conventionally includes techniques of XAFS (q.v.), which in turn includes both XANES and EXAFS (q.v.). An XAS spectrum may also be obtained using fluorescence, electron yield and scattering processes indirectly (i.e. without directly measuring the absorption of X-rays).