Difference between revisions of "Statistical descriptors"
From Online Dictionary of Crystallography
HowardFlack (talk | contribs) |
(Absent category replace by existing one) |
||
| Line 20: | Line 20: | ||
[[Category:Fundamental crystallography]] | [[Category:Fundamental crystallography]] | ||
| − | [[Category: | + | [[Category:English documentation]] |
Revision as of 10:59, 18 March 2009
Overview
A separate online document Statistical Descriptors in Crystallography prepared for the International Union of Crystallography provides an authoritative statement on some aspects of the use of statistics and statistical techniques in crystallography, principally that of least-squares refinement of diffraction data against an atomic model. The following topics are treated:
- Glossary
- Basic notions
- Uncertainty of measurement
- Refinement
- Refinement on I, |F|2 or |F|?
- Defects in the model
- Weighting schemes
- Recommendations
See also
Part 8 of International Tables of Crystallography, Volume C