Difference between revisions of "Resolution"
From Online Dictionary of Crystallography
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+ | <font color="red">Auflösung</font> (''Ge''). <font color="green">Resolución estructural</font> (''Sp''). | ||
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In crystal [[structure determination]], the term '''resolution''' is used to describe the ability to distinguish between neighbouring features in an electron density map. By convention, it is defined as the minimum plane spacing given by [[Bragg's law]] for a particular | In crystal [[structure determination]], the term '''resolution''' is used to describe the ability to distinguish between neighbouring features in an electron density map. By convention, it is defined as the minimum plane spacing given by [[Bragg's law]] for a particular | ||
set of X-ray diffraction intensities. The resolution improves with an increase in the maximum value of <math>(\sin\, \theta)/\lambda</math> at which reflections are measured. | set of X-ray diffraction intensities. The resolution improves with an increase in the maximum value of <math>(\sin\, \theta)/\lambda</math> at which reflections are measured. |
Revision as of 16:59, 17 November 2017
Auflösung (Ge). Resolución estructural (Sp).
In crystal structure determination, the term resolution is used to describe the ability to distinguish between neighbouring features in an electron density map. By convention, it is defined as the minimum plane spacing given by Bragg's law for a particular
set of X-ray diffraction intensities. The resolution improves with an increase in the maximum value of [math](\sin\, \theta)/\lambda[/math] at which reflections are measured.