Difference between revisions of "Resolution"
From Online Dictionary of Crystallography
BrianMcMahon (talk | contribs) |
ShigeruOhba (talk | contribs) m |
||
| (2 intermediate revisions by one other user not shown) | |||
| Line 1: | Line 1: | ||
| + | <font color="red">Auflösung</font> (''Ge''). <font color="purple">分解能</font> (''Ja''). <font color="green">Resolución estructural</font> (''Sp''). | ||
| + | |||
| + | |||
In crystal [[structure determination]], the term '''resolution''' is used to describe the ability to distinguish between neighbouring features in an electron density map. By convention, it is defined as the minimum plane spacing given by [[Bragg's law]] for a particular | In crystal [[structure determination]], the term '''resolution''' is used to describe the ability to distinguish between neighbouring features in an electron density map. By convention, it is defined as the minimum plane spacing given by [[Bragg's law]] for a particular | ||
set of X-ray diffraction intensities. The resolution improves with an increase in the maximum value of <math>(\sin\, \theta)/\lambda</math> at which reflections are measured. | set of X-ray diffraction intensities. The resolution improves with an increase in the maximum value of <math>(\sin\, \theta)/\lambda</math> at which reflections are measured. | ||
| Line 4: | Line 7: | ||
== See also == | == See also == | ||
| − | [[ | + | *[[Optical resolution]] |
[[Category:X-rays]] | [[Category:X-rays]] | ||
[[Category:Structure determination]] | [[Category:Structure determination]] | ||
Latest revision as of 13:42, 26 March 2019
Auflösung (Ge). 分解能 (Ja). Resolución estructural (Sp).
In crystal structure determination, the term resolution is used to describe the ability to distinguish between neighbouring features in an electron density map. By convention, it is defined as the minimum plane spacing given by Bragg's law for a particular
set of X-ray diffraction intensities. The resolution improves with an increase in the maximum value of [math](\sin\, \theta)/\lambda[/math] at which reflections are measured.